most citedWaferSegClassNet -- A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects

92 citations · 92 across the 1 of their papers we have counts for

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1 paper

cs.CV2022★ 92 cited

WaferSegClassNet -- A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects

Subhrajit Nag, Dhruv Makwana, Sai Chandra Teja R +2

As the integration density and design intricacy of semiconductor wafers increase, the magnitude and complexity of defects in them are also on the rise. Since the manual inspection…