40 citations · 44 across the 3 of their papers we have counts for
3 papers
Disorder and cavity evolution in single-crystalline Ge during implantation of Sb ions monitored in-situ by spectroscopic ellipsometry
Tivadar Lohner, Attila Nemeth, Zsolt Zolnai +12
Ion implantation has been a key technology for the controlled surface modification of materials in microelectronics and generally, for tribology, biocompatibility, corrosion resist…
Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry
Deshabrato Mukherjee, Benjamin Kalas, Sven Burger +4
Spectroscopic ellipsometry is a sensitive and optical model-supported quantitative tool to monitor interfaces. In this work, solid-liquid interfaces are studied using the Kretschma…
Large-area nanoengineering of graphene corrugations for visible-frequency graphene plasmons
Gergely Dobrik, Peter Nemes-Incze, Bruno Majerus +8
Quantum confinement of graphene carriers is an effective way to engineer its properties. It is commonly realized through physical edges that are associated with the deterioration o…