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eess.SP2023
An Empirical Study on Fault Detection and Root Cause Analysis of Indium Tin Oxide Electrodes by Processing S-parameter Patterns
Tae Yeob Kang, Haebom Lee, Sungho Suh
In the field of optoelectronics, indium tin oxide (ITO) electrodes play a crucial role in various applications, such as displays, sensors, and solar cells. Effective fault diagnosi…
cs.LG2023★ 2 cited
Non-destructive Fault Diagnosis of Electronic Interconnects by Learning Signal Patterns of Reflection Coefficient in the Frequency Domain
Tae Yeob Kang, Haebom Lee, Sungho Suh
Fault detection and diagnosis of the interconnects are crucial for prognostics and health management (PHM) of electronics. Traditional methods, which rely on electronic signals as…