4 citations · 6 across the 11 of their papers we have counts for
5 papers · 1 filter
Universal Drift Correction for Multidimensional Scanning Microscopy
Sangjoon Lee, William Millsaps, Dasol Yoon +7
In scanning microscopy, drift causes the specimen to be sampled at positions displaced from the nominal probe positions. This displacement alters the spatial assignment of the reco…
Bend Contour Electron Tomography (BCET): Quantitative strain and topography mapping
Henry G. Bell, Chenhang Xu, Arthur McCray +5
Freestanding thin films of quantum materials naturally develop sub-micrometer, nonuniform strain fields that strongly affect their electronic, magnetic, and structural properties i…
Real-space overlap is not enough: ambiguity in nanobeam iterative ptychography
Stephanie M. Ribet, Mohsen Danaie, Willem P. M. de Kleijne +5
High-resolution iterative ptychography typically relies on a well-aligned, high-convergence-angle electron probe. Here we explore whether it can instead be performed at small conve…
Mapping Order in Semicrystalline Polymers using Machine Learning of Nanobeam Electron Diffraction
Nicholas Marchese, Arthur R. C. McCray, Yael Tsarfati +4
Organic mixed ionic electronic conductors (OMIECs) are a promising class of polymer materials for applications spanning neuromorphic computation to energy efficient electronics and…
Model-free Analysis of Scattering and Imaging Data with Escort-Weighted Shannon Entropy and Divergence Matrices
Jared Coles, Arthur R. C. McCray, Yue Li +9
We demonstrate a model-free data analysis framework that leverages escort-weighted Shannon Entropy and several divergence matrices to detect phase transitions in scattering and ima…