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physics.app-ph2025★ 1 cited
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials
Hoelen L. Lalandec Robert, Max Leo Leidl, Knut Müller-Caspary +1
This publication presents an investigation of the performance of different analytical electron ptychography methods for low-dose imaging. In particular, benchmarking is performed f…
physics.app-ph2022
Scalable, Highly Crystalline, 2D Semiconductor Atomic Layer Deposition Process for High Performance Electronic Applications
Nikolaos Aspiotis, Katrina Morgan, Benjamin März +6
This work demonstrates a large area process for atomically thin 2D semiconductors to unlock the technological upscale required for their commercial uptake. The new atomic layer dep…