collaborators

1 paper

cs.LG2022

Multilayer Perceptron Based Stress Evolution Analysis under DC Current Stressing for Multi-segment Wires

Tianshu Hou, Peining Zhen, Ngai Wong +4

Electromigration (EM) is one of the major concerns in the reliability analysis of very large scale integration (VLSI) systems due to the continuous technology scaling. Accurately p…