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physics.ins-det2026
Optimization of qPlus sensor geometry and circuit for high-speed atomic force microscopy in liquid environments
Takashi Ichii, Shuji Tokitoh, Yuto Nishiwaki +1
Atomic force microscopy (AFM) using qPlus sensors is a powerful tool for high-resolution analysis in various liquids, including high-viscosity or opaque environments. However, the…
physics.ins-det2026
High-Temperature and High-Speed Atomic Force Microscopy Using a qPlus Sensor in Liquid via Quadpod Scanner and Hybrid-Loop Frequency Demodulation
Yuto Nishiwaki, Toru Utsunomiya, Takashi Ichii
Atomic-resolution imaging on molten metal/solid interfaces at temperatures above 200 °C was achieved using a high-temperature, high-speed atomic force microscope (AFM) equipped wit…