Steef Smit

most citedSpectroscopic signature of surface states and bunching of bulk subbands in topological insulator (Bi

_{0.4}

_{0.6}

)

_{2}

_{3}

thin films

5 citations · 5 across the 1 of their papers we have counts for

collaborators

1 paper

cond-mat.mtrl-sci2021★ 5 cited

Spectroscopic signature of surface states and bunching of bulk subbands in topological insulator (Bi $_{0.4}$ Sb $_{0.6}$ ) $_{2}$ Te $_{3}$ thin films

L. Mulder, C. Castenmiller, F. J. Witmans +5

High quality thin films of the topological insulator (Bi $_{0.4}$ Sb $_{0.6}$ ) $_{2}$ Te $_{3}$ have been deposited on SrTiO $_{3}$ (111) by molecular beam epitaxy. Their electronic structure w…

Spectroscopic signature of surface states and bunching of bulk subbands in topological insulator (Bi0.4​Sb0.6​)2​Te3​ thin films

Spectroscopic signature of surface states and bunching of bulk subbands in topological insulator (Bi $_{0.4}$ Sb $_{0.6}$ ) $_{2}$ Te $_{3}$ thin films