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Xiaolan Yan

1 paper here

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  • middle author1

Across the 1 of 1 paper where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci1
ORCID 0000-0003-1916-7305

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most citedTemperature Effect on Charge-state Transition Levels of Defects in Semiconductors

27 citations · 27 across the 1 of their papers we have counts for

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1 paper · 1 filter

cond-mat.mtrl-sci2022★ 27 cited

Temperature Effect on Charge-state Transition Levels of Defects in Semiconductors

Shuang Qiao, Yu-Ning Wu, Xiaolan Yan +3

Defects are crucial in determining the overall physical properties of semiconductors. Generally, the charge-state transition level (TEL), one of the key physical quantities that de…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.