15 citations · 22 across the 4 of their papers we have counts for
4 papers
New insights into the origin of the first sharp diffraction peak in amorphous silica from an analysis of chemical and radial ordering
Parthapratim Biswas, Devilal Dahal, Stephen R. Elliott
The structural origin of the first sharp diffraction peak (FSDP) in amorphous silica is studied by analyzing chemical and radial ordering of silicon (Si) and oxygen (O) atoms in bi…
Ab initio studies of the impact of the Debye-Waller factor on the structural and dynamical properties of amorphous semiconductors: The case of -Si
Devilal Dahal, Raymond Atta-Fynn, Stephen R. Elliott +1
This paper presents a first-principles study of the Debye-Waller factor and the Debye temperature for amorphous silicon (-Si) from lattice-dynamical calculations and direct mole…
Extended-range order in tetrahedral amorphous semiconductors: The case of amorphous silicon
Devilal Dahal, Stephen R. Elliott, Parthapratim Biswas
This paper reports the presence of extended-range ordering in the atomic pair-correlation function of amorphous silicon (-Si) using ultra-large atomistic models obtained from Mo…
On the origin and the structure of the first sharp diffraction peak of amorphous silicon
Devilal Dahal, Hiroka Warren, Parthapratim Biswas
The structure of the first sharp diffraction peak (FSDP) of amorphous silicon (-Si) near 2 Angstrom is addressed with particular emphasis on the position, intensity…