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physics.app-ph2025
Investigation of the Physical Mechanism behind Retention Loss in FeFETs with MIFIFIS Gate Structure
Tao Hu, Zeqi Chen, Runhao Han +19
A Metal-Gate Blocking Layer (GBL)- Ferroelectric-Tunnel Dielectric Layer (TDL)-Ferroelectric -Channel Insulator (Ch.IL)-Si (MIFIFIS) structure is proposed to achieve a larger MW fo…
physics.app-ph2024
Impact of Top SiO2 interlayer Thickness on Memory Window of Si Channel FeFET with TiN/SiO2/Hf0.5Zr0.5O2/SiOx/Si (MIFIS) Gate Structure
Tao Hu, Xianzhou Shao, Mingkai Bai +13
We study the impact of top SiO2 interlayer thickness on memory window of Si channel FeFET with TiN/SiO2/Hf0.5Zr0.5O2/SiOx/Si (MIFIS) gate structure. The memory window increases wit…
physics.app-ph2020★ 4 cited
Thermodynamic driving force of transient negative capacitance of ferroelectric capacitors
Yuanyuan Zhang, Xiaoqing Sun, Junshuai Chai +6
This paper investigates the thermodynamic driving force of transient negative capacitance (NC) in the series circuit of the resistor and ferroelectric capacitor (R-FEC). We find th…