14 citations · 18 across the 2 of their papers we have counts for
1 paper · 1 filter
Ming-Yen Kao, Harshit Agarwal, Yu-Hung Liao +6
A comprehensive study of the scaling of negative capacitance FinFET (NC-FinFET) is conducted with TCAD. We show that the NC-FinFET can be scaled to "2.1nm node" and almost "1.5nm n…