36 citations · 84 across the 3 of their papers we have counts for
3 papers
Comphy v3.0 -- A Compact-Physics Framework for Modeling Charge Trapping Related Reliability Phenomena in MOS Devices
Dominic Waldhoer, Christian Schleich, Jakob Michl +9
Charge trapping plays an important role for the reliability of electronic devices and manifests itself in various phenomena like bias temperature instability (BTI), random telegrap…
Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing
Arnout Beckers, Jakob Michl, Alexander Grill +7
Cryogenic semiconductor device models are essential in designing control systems for quantum devices and in benchmarking the benefits of cryogenic cooling for high-performance comp…
Millikelvin temperature cryo-CMOS multiplexer for scalable quantum device characterisation
Anton Potočnik, Steven Brebels, Jeroen Verjauw +11
Quantum computers based on solid state qubits have been a subject of rapid development in recent years. In current Noisy Intermediate-Scale Quantum (NISQ) technology, each quantum…