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cs.CV2024★ 2 cited
Combining unsupervised and supervised learning in microscopy enables defect analysis of a full 4H-SiC wafer
Binh Duong Nguyen, Johannes Steiner, Peter Wellmann +1
Detecting and analyzing various defect types in semiconductor materials is an important prerequisite for understanding the underlying mechanisms as well as tailoring the production…
cond-mat.mtrl-sci2024
DISO: A Domain Ontology for Modeling Dislocations in Crystalline Materials
Ahmad Zainul Ihsan, Said Fathalla, Stefan Sandfeld
Crystalline materials, such as metals and semiconductors, nearly always contain a special defect type called dislocation. This defect decisively determines many important material…