14 citations · 27 across the 2 of their papers we have counts for
2 papers
cs.CV2025★ 14 cited
Exploring Active Learning for Semiconductor Defect Segmentation
Lile Cai, Ramanpreet Singh Pahwa, Xun Xu +4
The development of X-Ray microscopy (XRM) technology has enabled non-destructive inspection of semiconductor structures for defect identification. Deep learning is widely used as t…
cs.CV2021★ 13 cited
Machine-learning based methodologies for 3d x-ray measurement, characterization and optimization for buried structures in advanced ic packages
Ramanpreet S Pahwa, Soon Wee Ho, Ren Qin +9
For over 40 years lithographic silicon scaling has driven circuit integration and performance improvement in the semiconductor industry. As silicon scaling slows down, the industry…