14 citations · 16 across the 2 of their papers we have counts for
3 papers · 1 filter
Exploring Active Learning for Semiconductor Defect Segmentation
Lile Cai, Ramanpreet Singh Pahwa, Xun Xu +4
The development of X-Ray microscopy (XRM) technology has enabled non-destructive inspection of semiconductor structures for defect identification. Deep learning is widely used as t…
DA-CIL: Towards Domain Adaptive Class-Incremental 3D Object Detection
Ziyuan Zhao, Mingxi Xu, Peisheng Qian +2
Deep learning has achieved notable success in 3D object detection with the advent of large-scale point cloud datasets. However, severe performance degradation in the past trained c…
Machine-learning based methodologies for 3d x-ray measurement, characterization and optimization for buried structures in advanced ic packages
Ramanpreet S Pahwa, Soon Wee Ho, Ren Qin +9
For over 40 years lithographic silicon scaling has driven circuit integration and performance improvement in the semiconductor industry. As silicon scaling slows down, the industry…