4 papers
Stacking fault segregation imaging with analytical field ion microscopy
F. F. Morgado, L. T. Stephenson, S. Bhatt +8
Stacking faults (SF) are important structural defects that play an essential role in the deformation of engineering alloys. However, direct observation of stacking faults at the at…
Three-dimensional atomically-resolved analytical imaging with a field ion microscope
Shyam Katnagallu, Felipe Felipe F. Morgado, Isabelle Mouton +2
Atom probe tomography (APT) helps elucidate the link between the nanoscale chemical variations and physical properties, but it has limited structural resolution. Field ion microsco…
Reflections on the spatial performance of atom probe tomography in the analysis of atomic neighbourhoods
Baptiste Gault, Benjamin Klaes, Felipe F. Morgado +5
Atom probe tomography is often introduced as providing "atomic-scale" mapping of the composition of materials and as such is often exploited to analyse atomic neighbourhoods within…
Revealing atomic-scale vacancy-solute interaction in nickel
Felipe F. Morgado, Shyam Katnagallu, Christoph Freysoldt +7
Imaging individual vacancies in solids and revealing their interactions with solute atoms remains one of the frontiers in microscopy and microanalysis. Here we study a creep-deform…