2 papers
cond-mat.mtrl-sci2022
Fully automated spectroscopic ellipsometry analyses of crystalline-phase semiconductors based on a new algorithm
Sara Maeda, Kohei Oiwake, Yukinori Nishigaki +8
One significant drawback of a spectroscopic ellipsometry (SE) technique is its time-consuming and often complicated analysis procedure necessary to assess the optical functions of…
physics.optics2021
Fully automated spectroscopic ellipsometry analyses: Application to MoOx thin films
Kohei Oiwake, Yukinori Nishigaki, Shohei Fujimoto +2
In spectroscopic ellipsometry, the optical properties of materials are obtained indirectly by generally assuming dielectric function and optical models. This ellipsometry analysis,…