10 citations · 16 across the 9 of their papers we have counts for
9 papers
Titanic overconfidence -- dark uncertainty can sink hybrid metrology for semiconductor manufacturing
Ronald G. Dixson, Adam L. Pintar, R. Joseph. Kline +4
Hybrid metrology for semiconductor manufacturing is on a collision course with dark uncertainty. An IEEE technology roadmap for this venture has targeted a linewidth uncertainty of…
Letter to the Editor Concerning "Simultaneous, Single-Particle Measurements of Size and Loading Give Insights into the Structure of Drug-Delivery Nanoparticles"
Andrew C. Madison, Adam L. Pintar, Craig R. Copeland +2
The vexing error of excess variance in the sizing of single particles degrades accuracy in applications ranging from quality control of nanoparticle products to hazard assessment o…
Simulation of Atlantic Hurricane Tracks and Features: A Deep Learning Approach
Rikhi Bose, Adam L. Pintar, Emil Simiu
The objective of this paper is to employ machine learning (ML) and deep learning (DL) techniques to obtain from input data (storm features) available in or derived from the HURDAT2…
Linearity Characterization and Uncertainty Quantification of Spectroradiometers via Maximum Likelihood and the Non-parametric Bootstrap
Adam L. Pintar, Zachary H. Levine, Howard W. Yoon +1
A technique for characterizing and correcting the linearity of radiometric instruments is known by the names the "flux-addition method" and the "combinatorial technique". In this p…
Data-Based Models for Hurricane Evolution Prediction: A Deep Learning Approach
Rikhi Bose, Adam Pintar, Emil Simiu
Fast and accurate prediction of hurricane evolution from genesis onwards is needed to reduce loss of life and enhance community resilience. In this work, a novel model development…
Sub-picoliter Traceability of Microdroplet Gravimetry and Microscopy
Lindsay C. C. Elliott, Adam L. Pintar, Craig R. Copeland +5
Gravimetry typically lacks the resolution to measure single microdroplets, whereas microscopy is often inaccurate beyond the resolution limit. To address these issues, we advance a…
Traceable localization enables accurate integration of quantum emitters and photonic structures with high yield
Craig R. Copeland, Adam L. Pintar, Ronald G. Dixson +6
Traceability to the International System of Units (SI) is fundamental to measurement accuracy and reliability. In this study, we demonstrate subnanometer traceability of localizati…
Demonstration of a laser powder bed fusion combinatorial sample for high-throughput microstructure and indentation characterization
Jordan S. Weaver, Adam L. Pintar, Carlos Beauchamp +3
High-throughput experiments that use combinatorial samples with rapid measurements can be used to provide process-structure-property information at reduced time, cost, and effort.…
A lateral nanoflow assay reveals nanoplastic fluorescence heterogeneity
Kuo-Tang Liao, Andrew C. Madison, Adam L. Pintar +3
Plastic nanoparticles present technological opportunities and environmental concerns, but measurement challenges impede product development and hazard assessment. To meet these cha…