606 citations · 606 across the 1 of their papers we have counts for
2 papers
cond-mat.mes-hall2008★ 606 cited
Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy
P. Nemes-Incze, Z. Osvath, K. Kamaras +1
Atomic Force Microscopy (AFM) in the tapping (intermittent contact) mode is a commonly used tool to measure the thickness of graphene and few layer graphene (FLG) flakes on silicon…
cond-mat.mtrl-sci2007★ 14 cited
Vibrational spectra of C60C8H8 and C70C8H8 in the rotor-stator and polymer phases
G. Klupp, F. Borondics, É. Kováts +6
C60-C8H8 and C70-C8H8 are prototypes of rotor-stator cocrystals. We present infrared and Raman spectra of these materials and show how the rotor-stator nature is reflected in their…