Characterization and Modeling of Self-Heating in Nanometer Bulk-CMOS at Cryogenic Temperatures

P. A. 't Hart, M. Babaie, A. Vladimirescu +1

This work presents a self-heating study of a 40-nm bulk-CMOS technology in the ambient temperature range from 300 K down to 4.2 K. A custom test chip was designed and fabricated fo…