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cond-mat.mes-hall2016★ 3 cited
Fabrication of sharp atomic force microscope probes using in-situ local electric field induced deposition under ambient conditions
Alexei Temiryazev, Sergey I. Bozhko, A. Edward Robinson +1
We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope, or to repair a damaged probe. The method is based o…
cond-mat.mes-hall2013
Pulse force nanolithography on hard surfaces using atomic force microscopy with a sharp single-crystal diamond tip
Alexei Temiryazev
AFM-based technique of nanolithography is proposed. The method enables rapid point by point indentation with a sharp tip. When used in tandem with single-crystal diamond tips, this…