1 citations · 2 across the 4 of their papers we have counts for
4 papers
Context-Aware Deep Learning for Defect Classification in Atomic-Resolution STEM
Jiadong Dan, Cheng Zhang, Leyi Loh +5
Artificial intelligence is rapidly advancing materials characterization, yet most applications in electron microscopy rely solely on image contrast, overlooking the chemical and ex…
Robust Ptychographic Reconstruction with an Out-of-Focus Electron Probe
Shoucong Ning, Wenhui Xu, Pengju Sheng +5
As a burgeoning technique, out-of-focus electron ptychography offers the potential for rapidly imaging atomic-scale large fields of view (FoV) using a single diffraction dataset. H…
An Integrated Constrained Gradient Descent (iCGD) Protocol to Correct Scan-Positional Errors for Electron Ptychography with High Accuracy and Precision
Shoucong Ning, Wenhui Xu, Leyi Loh +4
Correcting scan-positional errors is critical in achieving electron ptychography with both high resolution and high precision. This is a demanding and challenging task due to the s…
Mode-center Placement of Monolayer WS in a Photonic Polymer Waveguide
Angelina Frank, Justin Zhou, James A. Grieve +8
Effective integration of 2D materials such as monolayer transition metal dichalcogenides (TMDs) into photonic waveguides and integrated circuits is being intensely pursued due to t…