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cs.LG2026
A Mixture of Experts Foundation Model for Scanning Electron Microscopy Image Analysis
Sk Miraj Ahmed, Yuewei Lin, Chuntian Cao +9
Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional invest…
cond-mat.mtrl-sci2026
Substrate-Mediated Evaporation and Stochastic Evolution of Supported Au Nanoparticles
Dmitri N. Zakharov, Xiaohui Qu, Hong Wang +6
We use in situ transmission electron microscopy with automated tracking to study supported gold nanoparticles (NPs) during high-temperature vacuum annealing. \rev{The average mass…