78 citations · 142 across the 2 of their papers we have counts for
2 papers
cs.CV2021★ 64 cited
Multi defect detection and analysis of electron microscopy images with deep learning
Mingren Shen, Guanzhao Li, Dongxia Wu +12
Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalabl…
cs.CV2021★ 78 cited
A Deep Learning Based Automatic Defect Analysis Framework for In-situ TEM Ion Irradiations
Mingren Shen, Guanzhao Li, Dongxia Wu +4
Videos captured using Transmission Electron Microscopy (TEM) can encode details regarding the morphological and temporal evolution of a material by taking snapshots of the microstr…