S. Buchberger

most citedX-ray diffraction tools for structural modeling of epitaxic films of an intrinsic antiferromagnetic topological insulator

1 citations · 1 across the 2 of their papers we have counts for

collaborators

2 papers

cond-mat.mtrl-sci2021

Simulation of X-ray diffraction in Mn $_{x}$ Bi $_{2}$ Te $_{3 + x}$ epitaxic films

Rafaela F. S. Penacchio, Celso I. Fornari, Yori G. Camillo +6

Disordered heterostructures stand as a general description for compounds that are part of homologous series such as bismuth chalcogenides. In device engineering, van der Waals epit…

cond-mat.mtrl-sci2021★ 1 cited

X-ray diffraction tools for structural modeling of epitaxic films of an intrinsic antiferromagnetic topological insulator

Rafaela F. S. Penacchio, Celso I. Fornari, Yori G. Camillo +6

Synthesis of new materials demands structural analysis tools suited to the particularities of each system. Van der Waals (vdW) materials are fundamental in emerging technologies of…

Simulation of X-ray diffraction in Mnx​Bi2​Te3+x​ epitaxic films

X-ray diffraction tools for structural modeling of epitaxic films of an intrinsic antiferromagnetic topological insulator

Simulation of X-ray diffraction in Mn $_{x}$ Bi $_{2}$ Te $_{3 + x}$ epitaxic films