activity
20152022
most citedThe lower limit for time resolution in frequency modulation atomic force microscopy

55 citations · 109 across the 5 of their papers we have counts for

collaborators

5 papers

cond-mat.mtrl-sci2022★ 19 cited

Ultrafast electron localization and screening in a transition metal dichalcogenide

Z. Schumacher, S. A. Sato, S. Neb +4

The coupling of light to electrical charge carriers in semiconductors is the foundation of many technological applications. Attosecond transient absorption spectroscopy measures si…

physics.app-ph2021

How high is a MoSe monolayer?

Rikke Plougmann, Megan Cowie, Yacine Benkirane +3

Transition metal dichalcogenides (TMDCs) have attracted significant attention for optoelectronic, photovoltaic and photoelectrochemical applications. The properties of TMDCs are hi…

cond-mat.mes-hall2020★ 9 cited

Charge carrier inversion in a doped thin film organic semiconductor island

Zeno Schumacher, Rasa Rejali, Megan Cowie +3

Inducing an inversion layer in organic semiconductors is a highly nontrivial, but critical, achievement for producing organic field-effect transistor (OFET) devices, which rely on…

cond-mat.mes-hall2016★ 55 cited

The lower limit for time resolution in frequency modulation atomic force microscopy

Zeno Schumacher, Andreas Spielhofer, Yoichi Miyahara +1

Atomic force microscopy (AFM) routinely achieves structural information in the sub-nm length scale. Measuring time resolved properties on this length scale to understand kinetics a…

cond-mat.mes-hall2015★ 26 cited

Kelvin probe force microscopy by direct dissipative electrostatic force modulation

Yoichi Miyahara, Jessica Topple, Zeno Schumacher +1

We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedba…