4 papers · 1 filter
Do Reviews Matter for Recommendations in the Era of Large Language Models?
Chee Heng Tan, Huiying Zheng, Jing Wang +5
With the advent of large language models (LLMs), the landscape of recommender systems is undergoing a significant transformation. Traditionally, user reviews have served as a criti…
Physics Informed Generative Models for Magnetic Field Images
Aye Phyu Phyu Aung, Lucas Lum, Zhansen Shi +5
In semiconductor manufacturing, defect detection and localization are critical to ensuring product quality and yield. While X-ray imaging is a reliable non-destructive testing meth…
A Spatial-Physics Informed Model for 3D Spiral Sample Scanned by SQUID Microscopy
J. Senthilnath, Jayasanker Jayabalan, Zhuoyi Lin +5
The development of advanced packaging is essential in the semiconductor manufacturing industry. However, non-destructive testing (NDT) of advanced packaging becomes increasingly ch…
3D Magnetic Inverse Routine for Single-Segment Magnetic Field Images
J. Senthilnath, Chen Hao, F. C. Wellstood
In semiconductor packaging, accurately recovering 3D information is crucial for non-destructive testing (NDT) to localize circuit defects. This paper presents a novel approach call…