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cond-mat.mtrl-sci2021★ 2 cited
Humble planar defects in SiGe nanopillars
Hongbin Yang, Shang Ren, Sobhit Singh +5
We report a new \{001\} planar defect found in SiGe nanopillars. The defect structure, determined by atomic resolution electron microscopy, matches the Humble defect model proposed…
cond-mat.mtrl-sci2021
Polarization selectivity of aloof-beam electron energy-loss spectroscopy in one-dimensional ZnO nanorods
Yao-Wen Yeh, Sobhit Singh, David Vanderbilt +1
Orientation dependent electronic properties of wurtzite zinc oxide nanorods are characterized by aloof beam electron energy-loss spectroscopy (EELS) carried out in a scanning trans…