3 papers
cond-mat.mtrl-sci2024
Deciphering the Nanoscale Frictional Properties of Two-Dimensional SnSe and SnSe with Lateral Force Microscopy
M. Ozdogan, T. Iken, D. Cakir +1
In this study, we employed lateral force microscopy, a specialized technique within atomic force microscopy, to explore the nanoscale frictional properties of 2D SnSe and SnSe…
cond-mat.mtrl-sci2024
Thermal properties of SnSe nanoflakes by AFM-based Scanning Thermal Microscopy measurements
M. Ozdogan, T. Iken, D. Cakir +1
We investigated the thermal resistance of SnSe nanoflakes using scanning thermal microscopy, an extension of atomic force microscopy that allows for nanoscale thermal mapping. The…
physics.chem-ph2024
A systematic study to investigate the effects of X-ray exposure on electrical properties of silicon dioxide thin films using X-ray photoelectron spectroscopy
Carlos Munoz, Thomas Iken, Nuri Oncel
X-ray Photoelectron Spectroscopy (XPS) is generally used for chemical analysis of surfaces and interfaces. This method involves the analysis of changes in binding energies and peak…