Pavel Ondravcka

activity

20212026

collaborators

3 papers

cond-mat.mtrl-sci2026

Effect of oxygen content on optical, structural, and dielectric properties of Al $_{x}$ Ta $_{y}$ O $_{z}$ $ thin films

Pavel Ondračka, Richard Drevet, Daniel Franta +3

This study reports on the optical, structural, and dielectric properties of aluminum tantalum oxide (Al $_{x}$ Ta $_{y}$ O $_{z}$ ) thin films deposited at low temperature on silicon and steel…

cond-mat.mtrl-sci2024

Prediction and identification of point defect fingerprints in X-ray photoelectron spectra of TiN $_{x}$ with 1.18 $\leq x \leq$ 1.37

Pavel Ondračka, Pauline Kümmerl, Marcus Hans +5

We investigate the effect of selected N and Ti point defects in $B$ 1 TiN on N 1s and Ti\,2p $_{3/2}$ binding energies (BE) by experiments and ab initio calculations. X-ray photoelec…

cond-mat.mtrl-sci2021

$Ab initio$ -guided X-ray photoelectron spectroscopy quantification of Ti vacancies in Ti $_{1 - δ}$ O $_{x}$ N $_{1 - x}$ thin films

Pavel Ondračka, Marcus Hans, Damian M. Holzapfel +3

$Ab initio$ calculations were employed to investigate the effect of oxygen concentration dependent Ti vacancies formation on the core electron binding energy shifts in cub…

Effect of oxygen content on optical, structural, and dielectric properties of Alx​Tay​Oz​$ thin films

Prediction and identification of point defect fingerprints in X-ray photoelectron spectra of TiNx​ with 1.18 ≤x≤ 1.37

Ab initio-guided X-ray photoelectron spectroscopy quantification of Ti vacancies in Ti1−δ​Ox​N1−x​ thin films

Effect of oxygen content on optical, structural, and dielectric properties of Al $_{x}$ Ta $_{y}$ O $_{z}$ $ thin films

Prediction and identification of point defect fingerprints in X-ray photoelectron spectra of TiN $_{x}$ with 1.18 $\leq x \leq$ 1.37

$Ab initio$ -guided X-ray photoelectron spectroscopy quantification of Ti vacancies in Ti $_{1 - δ}$ O $_{x}$ N $_{1 - x}$ thin films