2 papers
cs.CV2026
ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing
Wei Sun, Weixia Zhang, Linhan Cao +30
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for Hi…
cs.CV2024
Image Segmentation in Foundation Model Era: A Survey
Tianfei Zhou, Wang Xia, Fei Zhang +5
Image segmentation is a long-standing challenge in computer vision, studied continuously over several decades, as evidenced by seminal algorithms such as N-Cut, FCN, and MaskFormer…