collaborators

1 paper

cond-mat.mtrl-sci2026

Atomic-Scale Characterization of Oxide Interfaces and Superlattices Using Scanning Transmission Electron Microscopy

Steven R. Spurgeon, Renae N. Gannon

Scanning transmission electron microscopy (STEM) is a cornerstone of our understanding of oxide interfaces and superlattices. No other technique provides the same level of insight…