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most citedModeling Discrete Coating Degradation Events via Hawkes Processes

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cs.CV2021

Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy

Josh Kacher, Yao Xie, Sven P. Voigt +4

Transmission Electron Microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TE…