2 papers
cond-mat.mtrl-sci2024
Measuring Minority Carrier Diffusion Length Using High-Injection Scanning Photocurrent Microscopy
Xiujun Lian, Hanwei Gao
Scanning photocurrent microscopy (SPCM) has been widely used for characterizing charge transport properties, in particular, the minority carrier diffusion length of semiconductors.…
cond-mat.mtrl-sci2018
Bulk Fermi surfaces of the Dirac Type-II Semimetallic Candidates VAl3, NbAl3 and TaAl3
K. -W. Chen, X. Lian, Y. Lai +7
We report a de Haas-van Alphen (dHvA) effect study on the Dirac type-II semimetallic candidates \emph{M}Al (where, \emph{M} = V, Nb and Ta). The angular-dependence of their Fer…