14 citations · 20 across the 2 of their papers we have counts for
2 papers
physics.ins-det2024★ 6 cited
Fine residual stress distribution measurement of steel materials by SOI pixel detector with synchrotron X-rays
Ryutaro Nishimura, Shunji Kishimoto, Toshihiko Sasaki +4
Residual stress is an important factor governing evaluating and controlling the quality of metal materials in industrial products. X-ray measurements provide one of the most effect…
physics.ins-det2018★ 14 cited
Development of Integration-Type Silicon-On-Insulator Monolithic Pixel Detectors by Using a Float Zone Silicon
S. Mitsui, Y. Arai, T. Miyoshi +1
In this paper, we describe the development of monolithic pixel detectors by using a Silicon-on-Insulator (SOI) technology for X-ray and charged particle applications. The detectors…