activity
20182026
most citedIndustrially Microfabricated Ion Trap with 1 eV Trap Depth

27 citations · 54 across the 6 of their papers we have counts for

collaborators

6 papers

quant-ph2026

Demonstration of transport in an ion trap design for two-dimensional lattices

Michael Pfeifer, Marco Valentini, Matthias Dietl +7

Microfabricated ion trap chips are at the core of some of the most advanced quantum computers. How a large number of ions is arranged and controlled on an ion trap chip depends on…

quant-ph2026

Demonstration of a Multiplexing Trapped Ion Quantum Processing Unit

F. Anmasser, M. Abu Zahra, K. Schüppert +9

A fault-tolerant quantum computer is expected to require thousands of qubits. Trapped ion architectures provide a modular approach where the quantum register is divided into multip…

quant-ph2024★ 4 cited

Demonstration of two-dimensional connectivity for a scalable error-corrected ion-trap quantum processor architecture

Marco Valentini, Martin W. van Mourik, Friederike Butt +12

A major hurdle for building a large-scale quantum computer is increasing the number of qubits while maintaining connectivity between them. In trapped-ion devices, this connectivity…

physics.optics2024★ 5 cited

Femtosecond laser written waveguides in sapphire for visible light delivery

Sarah Winkler, Joachim R. Krenn, Jakob Wahl +8

A promising solution for scalable integrated optics of trapped-ion quantum processors are curved waveguides guiding visible light within sapphire bulk material. To the best of our…

quant-ph2022★ 27 cited

Industrially Microfabricated Ion Trap with 1 eV Trap Depth

S. Auchter, C. Axline, C. Decaroli +12

Scaling trapped-ion quantum computing will require robust trapping of at least hundreds of ions over long periods, while increasing the complexity and functionality of the trap its…

physics.atom-ph2018★ 18 cited

Observation of superconductivity and surface noise using a single trapped ion as a field probe

K. Lakhmanskiy, P. C. Holz, D. Schärtl +5

Measuring and understanding electric field noise from bulk material and surfaces is important for many areas of physics. In this work, we introduce a method to detect in situ diffe…