2 papers
cs.OH2018
Advanced In-Design Auto-Fixing Flow for Cell Abutment Pattern Matching Weakpoints
Yongfu Li, Valerio Perez, I-Lun Tseng +4
Pattern matching design verification has gained noticeable attention in semiconductor technologies as it can precisely identify more localized problematic areas (weakpoints) in the…
cs.OH2018
In Design DFM Rule Scoring and Fixing Method using ICV
Vikas Tripathi, Yongfu Li, Zhao Chuan Lee +3
As compared to DRC rules, DFM rules are a list of selected recommended rules which aim to improve the design margins for better manufacturability. In GLOBALFOUNDRIES, we use DFM sc…