activity
20142025
most citedGaia Data Release 2. Summary of the contents and survey properties

8.6k citations · 9.5k across the 6 of their papers we have counts for

collaborators

6 papers

astro-ph.IM2025★ 1 cited

Photometric Redshift Estimation for Rubin Observatory Data Preview 1 with Redshift Assessment Infrastructure Layers (RAIL)

T. Zhang, E. Charles, J. F. Crenshaw +87

We present the first systematic analysis of photometric redshifts (photo-z) estimated from the Rubin Observatory Data Preview 1 (DP1) data taken with the Legacy Survey of Space and…

astro-ph.GA2018★ 8.6k cited

Gaia Data Release 2. Summary of the contents and survey properties

Gaia Collaboration, A. G. A. Brown, A. Vallenari +4

We present the second Gaia data release, Gaia DR2, consisting of astrometry, photometry, radial velocities, and information on astrophysical parameters and variability, for sources…

astro-ph.IM2018★ 211 cited

Gaia Data Release 2: Properties and validation of the radial velocities

D. Katz, P. Sartoretti, M. Cropper +51

For Gaia DR2 (GDR2), 280 million spectra, collected by the RVS instrument on-board Gaia, were processed and median radial velocities were derived for 9.8 million sources brighter t…

astro-ph.GA2016★ 618 cited

Gaia Data Release 1: Astrometry - one billion positions, two million proper motions and parallaxes

L. Lindegren, U. Lammers, U. Bastian +80

Gaia Data Release 1 (Gaia DR1) contains astrometric results for more than 1 billion stars brighter than magnitude 20.7 based on observations collected by the Gaia satellite during…

astro-ph.IM2015★ 1 cited

The Gaia Basic angle: measurement and variations

Alcione Mora, Ulrich Bastian, Michael Biermann +5

The ESA Gaia mission uses two telescopes to create the most ambitious survey of the Galaxy. The angle between them must be known with exquisite precision and accuracy. An interfero…

astro-ph.IM2014★ 13 cited

Gaia on-board metrology: basic angle and best focus

A. Mora, M. Biermann, A. G. A. Brown +21

The Gaia payload ensures maximum passive stability using a single material, SiC, for most of its elements. Dedicated metrology instruments are, however, required to carry out two f…