37 citations · 66 across the 4 of their papers we have counts for
4 papers
Ultra-Wide Bandgap GaO-on-SiC MOSFETs
Yiwen Song, Arkka Bhattacharyya, Anwarul Karim +8
Ulta-wide bandgap semiconductors based on -GaO offer the potential to achieve higher power switching performance, efficiency, and lower manufacturing cost than today's w…
Accurate localization microscopy by intrinsic aberration calibration
Craig R. Copeland, Craig D. McGray, B. Robert Ilic +2
A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting…
Particle tracking of microelectromechanical system performance and reliability
Craig R. Copeland, Craig D. McGray, Jon Geist +1
Microelectromechanical systems (MEMS) that require contact of moving parts to implement complex functions exhibit limits to their performance and reliability. Here, we advance our…
Subnanometer localization accuracy in widefield optical microscopy
Craig R. Copeland, Jon Geist, Craig D. McGray +4
The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a wides…