37 citations · 116 across the 9 of their papers we have counts for
8 papers
Letter to the Editor Concerning "Simultaneous, Single-Particle Measurements of Size and Loading Give Insights into the Structure of Drug-Delivery Nanoparticles"
Andrew C. Madison, Adam L. Pintar, Craig R. Copeland +2
The vexing error of excess variance in the sizing of single particles degrades accuracy in applications ranging from quality control of nanoparticle products to hazard assessment o…
Sub-picoliter Traceability of Microdroplet Gravimetry and Microscopy
Lindsay C. C. Elliott, Adam L. Pintar, Craig R. Copeland +5
Gravimetry typically lacks the resolution to measure single microdroplets, whereas microscopy is often inaccurate beyond the resolution limit. To address these issues, we advance a…
Traceable localization enables accurate integration of quantum emitters and photonic structures with high yield
Craig R. Copeland, Adam L. Pintar, Ronald G. Dixson +6
Traceability to the International System of Units (SI) is fundamental to measurement accuracy and reliability. In this study, we demonstrate subnanometer traceability of localizati…
A lateral nanoflow assay reveals nanoplastic fluorescence heterogeneity
Kuo-Tang Liao, Andrew C. Madison, Adam L. Pintar +3
Plastic nanoparticles present technological opportunities and environmental concerns, but measurement challenges impede product development and hazard assessment. To meet these cha…
Unmasking the resolutionthroughput tradespace of focused-ion-beam machining
Andrew C. Madison, John S. Villarrubia, Kuo-Tang Liao +6
Focused-ion-beam machining is a powerful process to fabricate complex nanostructures, often through a sacrificial mask that enables milling beyond the resolution limit of the ion b…
Accurate localization microscopy by intrinsic aberration calibration
Craig R. Copeland, Craig D. McGray, B. Robert Ilic +2
A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting…
Particle tracking of microelectromechanical system performance and reliability
Craig R. Copeland, Craig D. McGray, Jon Geist +1
Microelectromechanical systems (MEMS) that require contact of moving parts to implement complex functions exhibit limits to their performance and reliability. Here, we advance our…
Subnanometer localization accuracy in widefield optical microscopy
Craig R. Copeland, Jon Geist, Craig D. McGray +4
The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a wides…