activity
20172023
most citedTraceable localization enables accurate integration of quantum emitters and photonic structures with high yield

2 citations · 2 across the 3 of their papers we have counts for

collaborators

8 papers

cond-mat.soft2023

Letter to the Editor Concerning "Simultaneous, Single-Particle Measurements of Size and Loading Give Insights into the Structure of Drug-Delivery Nanoparticles"

Andrew C. Madison, Adam L. Pintar, Craig R. Copeland +2

The vexing error of excess variance in the sizing of single particles degrades accuracy in applications ranging from quality control of nanoparticle products to hazard assessment o…

physics.app-ph2021

Sub-picoliter Traceability of Microdroplet Gravimetry and Microscopy

Lindsay C. C. Elliott, Adam L. Pintar, Craig R. Copeland +5

Gravimetry typically lacks the resolution to measure single microdroplets, whereas microscopy is often inaccurate beyond the resolution limit. To address these issues, we advance a…

physics.optics2021★ 2 cited

Traceable localization enables accurate integration of quantum emitters and photonic structures with high yield

Craig R. Copeland, Adam L. Pintar, Ronald G. Dixson +6

Traceability to the International System of Units (SI) is fundamental to measurement accuracy and reliability. In this study, we demonstrate subnanometer traceability of localizati…

cond-mat.soft2021

A lateral nanoflow assay reveals nanoplastic fluorescence heterogeneity

Kuo-Tang Liao, Andrew C. Madison, Adam L. Pintar +3

Plastic nanoparticles present technological opportunities and environmental concerns, but measurement challenges impede product development and hazard assessment. To meet these cha…

physics.app-ph2020

Unmasking the resolutionthroughput tradespace of focused-ion-beam machining

Andrew C. Madison, John S. Villarrubia, Kuo-Tang Liao +6

Focused-ion-beam machining is a powerful process to fabricate complex nanostructures, often through a sacrificial mask that enables milling beyond the resolution limit of the ion b…

physics.optics2020

Accurate localization microscopy by intrinsic aberration calibration

Craig R. Copeland, Craig D. McGray, B. Robert Ilic +2

A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting…