2 papers
physics.optics2018
Single-beam reflection technique for determination of nonlinear-refractive index of thin-film semiconductors using an electrically focus tunable lens
Juan Serna, Julián Henao, Edgar Rueda +2
In this paper, we propose a technique named reflection F-scan or RF-scan, that can be used to measure the nonlinear-refractive index n_2 of thin-film semiconductors. In this techni…
physics.app-ph2018
Two-photon absorption coefficient determination with a differential F-scan technique
Edgar Rueda, Juan H. Serna, Abdulatiff Hamad +1
In this paper we present a modification to the recently proposed transmission F-scan technique, the differential F-scan technique. In differential F-scan technique the programmed f…