2 papers
physics.acc-ph2026
Characterizing an inverse Compton X-ray source and determining its electron beam parameters using a genetic algorithm
Johannes Melcher, Jen-Fu Tu, BalÅ¡a TerziÄ +5
Inverse Compton X-ray sources are laboratory-scale devices providing quasi-monochromatic synchrotron radiation which is generated by laser photons Compton-scattering off highly rel…
physics.optics2026
Super-Resolution Structured-Illumination X-Ray Microscopy based on Fourier Decomposition
Stefan Schwaiger, Lennart Forster, Martin Dierolf +2
X-ray microscopy has become an important tool for non-destructive testing, e.g., in battery research. However, imaging a cm-scale battery cell at the desired (sub-)micrometer resol…