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eess.IV2024★ 4 cited
Resolution Enhancement of Scanning Electron Micrographs using Artificial Intelligence
Tom Reclik, Setareh Medghalchi, Philipp Schumacher +4
Scanning Electron Microscopy (SEM) is pivotal in revealing intricate micro- and nanoscale features across various research fields. However, obtaining high-resolution SEM images pre…
cond-mat.mtrl-sci2024
Mechanical properties and deformation mechanisms of the C14 Laves and μ-phase in the ternary Ta-Fe(-Al) system
Christina Gasper, Elif Merve Soysal, Nisa Ulumuddin +4
As structural and functional materials, topologically close-packed (TCP) phases of transition metal compounds offer a wide range of attractive properties. Due to their complex crys…