12 citations · 12 across the 1 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2023★ 12 cited
Resolving buried interfaces with Low Energy Ion Scattering
Adele Valpreda, Jacobus M. Sturm, Andrey Yakshin +1
We investigate the use of Low Energy Ion Scattering (LEIS) to characterize buried interfaces of ultra-thin films. LEIS spectra contain depth-resolved information in the so-called s…
cond-mat.mtrl-sci2018
Limits of surface analysis of thin film compounds using LEIS
Andrey A. Zameshin, Andrey E. Yakshin, Jacobus M. Sturm +2
Low Energy Ion Scattering (LEIS) was employed to study the surface composition of thin films of Ru on B, C and B4C films at different stages of growth. Effects of surface segregati…