3 citations · 3 across the 4 of their papers we have counts for
4 papers
From Artefact to Insight: Efficient Low-Rank Adaptation of BrushNet for Scanning Probe Microscopy Image Restoration
Ziwei Wei, Yao Shen, Wanheng Lu +2
Scanning Probe Microscopy or SPM offers nanoscale resolution but is frequently marred by structured artefacts such as line scan dropout, gain induced noise, tip convolution, and ph…
PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy
Ziwei Wei, Shuming Wei, Qibin Zeng +3
We have developed a Parallel Integrated Control and Training System, leveraging the deep reinforcement learning to dynamically adjust the control strategies in real time for scanni…
Variation of Contact Resonance Frequency during Domain Switching in PFM Measurements for Ferroelectric Materials
Yue Liu, Yao Sun, Wanheng Lu +5
Piezoresponse Force Spectroscopy (PFS) is a powerful method widely used for measuring the nanoscale ferroelectric responses of the materials. However, it is found that certain non-…
General Resolution Enhancement Method in Atomic Force Microscopy (AFM) Using Deep Learning
Y. Liu, Q. M. Sun, Dr. W. H. Lu +5
This paper develops a resolution enhancement method for post-processing the images from Atomic Force Microscopy (AFM). This method is based on deep learning neural networks in the…