3 papers
cond-mat.mtrl-sci2025
PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy
Ziwei Wei, Shuming Wei, Qibin Zeng +3
We have developed a Parallel Integrated Control and Training System, leveraging the deep reinforcement learning to dynamically adjust the control strategies in real time for scanni…
cond-mat.mtrl-sci2018
Variation of Contact Resonance Frequency during Domain Switching in PFM Measurements for Ferroelectric Materials
Yue Liu, Yao Sun, Wanheng Lu +5
Piezoresponse Force Spectroscopy (PFS) is a powerful method widely used for measuring the nanoscale ferroelectric responses of the materials. However, it is found that certain non-…
physics.data-an2018
General Resolution Enhancement Method in Atomic Force Microscopy (AFM) Using Deep Learning
Y. Liu, Q. M. Sun, Dr. W. H. Lu +5
This paper develops a resolution enhancement method for post-processing the images from Atomic Force Microscopy (AFM). This method is based on deep learning neural networks in the…