126 citations · 208 across the 4 of their papers we have counts for
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cond-mat.mtrl-sci2022★ 34 cited
Imaging the electron charge density in monolayer MoS2 at the Ångstrom scale
Joel Martis, Sandhya Susarla, Archith Rayabharam +15
Four-dimensional scanning transmission electron microscopy (4D-STEM) has recently gained widespread attention for its ability to image atomic electric fields with sub-Ångstrom spat…
cond-mat.mtrl-sci2017★ 45 cited
Native point defects of semiconducting layered Bi2O2Se
Huanglong Li, Xintong Xu, Yi Zhang +3
Bi2O2Se is an emerging semiconducting, air-stable layered material (Nat. Nanotechnol. 2017, 12, 530; Nano Lett. 2017, 17, 3021), potentially exceeding MoS2 and phosphorene in elect…