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cond-mat.mtrl-sci2018★ 24 cited
Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces
Randall L. Headrick, Jeffrey G. Ulbrandt, Peco Myint +6
The properties of artificially grown thin films are strongly affected by surface processes during growth. Coherent X-rays provide an approach to better understand such processes an…
cond-mat.mtrl-sci2015
Nucleation and strain-stabilization during organic semiconductor thin film deposition
Yang Li, Jing Wan, Detlef-M. Smilgies +3
The nucleation mechanisms during solution deposition of organic semiconductor thin films determine the grain morphology and may influence the crystalline packing in some cases. Her…