A Highly Accurate Model Based Registration Method for FIB-SEM Images of Neurons

Hans Jacob Teglbjærg Stephensen, Sune Darkner, Jon Sporring

Focused Ion Beam Scanning Electron Microscope (FIB-SEM) imaging is a technique that image materials section-by-section at nano-resolution, e.g.,5 nanometer width voxels. FIB-SEM is…