most citedIdentification of Defective Two Dimensional Semiconductors by Multifractal Analysis: The Single-layer Case Study

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cond-mat.mtrl-sci2018★ 5 cited

Identification of Defective Two Dimensional Semiconductors by Multifractal Analysis: The Single-layer Case Study

Reza Shidpour, S. M. S. Movahed

Two dimensional semiconductor such as single-layer transition metal dichalcogenides (SL-TMD) have attracted most attentions as an atomically thin layer semiconductor materials. Typ…